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Agilent E4428C ESG Analog Signal Generator

E4428C

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Product Overview: Agilent E4428C ESG Analog Signal Generator

Signal Characteristics



  • 250 kHz to 3 or 6 GHz (.01 Hz resolution)
  • -136 to 17 dBm @ 1 GHZ and 10 dBm @ 6 GHz output power
  • +/-0.5 to +/-0.9 dB level accuracy (> -110 dBm)

Spectral Purity



  • -134 dBc/Hz SSB phase noise @ 20 kHz offset, 1 GHz carrier (typ)
  • Enhanced phase noise performance (Option UNJ) ships standard
  • High-stability timebase: oven-controlled crystal oscillator (OXCO)

Modulation and Sweep



  • AM, FM, ØM, and pulse modulation
  • DC to 10 MHz FM modulation rates, maximum deviations up to 8 MHz
  • Dual internal function generators: sine, square, ramp, triangle, noise, DC, pulse, swept sine, dual sine
  • Step and list sweep (frequency and power)

Automation and Communication Interface



  • 10BaseT LAN and GPIB
  • SCPI and IVI-COM drivers
  • Backwards compatible with all ESG signal generators

Excellent all-inclusive RF and analog modulation performance up to 3 or 6 GHz
The E4428C ESG analog signal generator delivers outstanding spectral purity, level accuracy, output power, and analog modulation performance up to 3 or 6 GHz for all general-purpose test needs. This makes the E4428C ESG a superb choice for general-purpose tests requiring CW, AM, ØM, and FM receiver and component test signals in the cellular, ISM, and UNII frequency bands.


Lowest Single-Sideband phase noise performance in its price class
Single-Sideband (SSB) phase noise is an extremely important specification of a signal generator. For example, if used for measuring the adjacent channel selectivity of a receiver, your test results might indicate a failure when your receiver is actually functioning properly if the phase noise of the signal generator is too high. With a typical SSB phase noise performance of -134 dBc/Hz at 20 kHz offset from a 1 GHz carrier, the E4428C ESG will meet your demanding performance needs. Other key applications that require high spectral purity include LO substitution, low-jitter clock stimulus, blocking/interference signals, and in-channel measurements close to the carrier.